{"id":266,"date":"2026-02-01T12:27:19","date_gmt":"2026-02-01T04:27:19","guid":{"rendered":"https:\/\/mofei-lab.site\/?p=266"},"modified":"2026-02-18T23:38:53","modified_gmt":"2026-02-18T15:38:53","slug":"%e9%93%81%e7%94%b5%e5%ad%98%e5%82%a8%e5%99%a8%e5%8f%af%e9%9d%a0%e6%80%a7%e7%a0%94%e7%a9%b6","status":"publish","type":"post","link":"https:\/\/mofei-lab.site\/en\/2026\/02\/01\/%e9%93%81%e7%94%b5%e5%ad%98%e5%82%a8%e5%99%a8%e5%8f%af%e9%9d%a0%e6%80%a7%e7%a0%94%e7%a9%b6\/","title":{"rendered":"Reliability Study of Ferroelectric Memory"},"content":{"rendered":"<p>\u968f\u7740\u9ad8\u6027\u80fd\u8ba1\u7b97\u4e0e\u5927\u6570\u636e\u5b58\u50a8\u9700\u6c42\u7684\u6301\u7eed\u6500\u5347\uff0c\u5f00\u53d1\u5177\u5907\u9ad8\u5bc6\u5ea6\u3001\u9ad8\u901f\u5ea6\u548c\u9ad8\u53ef\u9760\u6027\u7684\u5b58\u50a8\u6280\u672f\uff0c\u5df2\u6210\u4e3a\u5f53\u524d\u534a\u5bfc\u4f53\u4ea7\u4e1a\u53d1\u5c55\u7684\u91cd\u8981\u7a81\u7834\u53e3\uff0c\u800c\u5b58\u50a8\u5668\u4ecb\u8d28\u6750\u6599\u7684\u521b\u65b0\u4e0e\u7814\u53d1\u6b63\u5c55\u73b0\u51fa\u65e5\u76ca\u7a81\u51fa\u7684\u6218\u7565\u4ef7\u503c\u3002\u5176\u4e2d\uff0cHfO\u2082\u57fa\u8584\u819c\u4f5c\u4e3a\u4e00\u79cd\u5173\u952e\u4ecb\u8d28\u6750\u6599\uff0c\u4e0d\u4ec5\u5728\u4f20\u7edf\u52a8\u6001\u968f\u673a\u5b58\u50a8\u5668\uff08DRAM\uff09\u4e2d\u4f5c\u4e3a\u9ad8\u4ecb\u7535\u7535\u5bb9\u5668\u6750\u6599\u5b9e\u73b0\u6210\u529f\u5e94\u7528\uff0c\u66f4\u56e0\u5176\u72ec\u7279\u7684\u94c1\u7535\u6027\u80fd\uff0c\u6210\u4e3a\u65b0\u578b\u94c1\u7535\u5b58\u50a8\u5668\uff08FeRAM\uff09\u4e2d\u6781\u5177\u6f5c\u529b\u7684\u7535\u5bb9\u5668\u5019\u9009\u6750\u6599\uff0c\u5176\u4ecb\u7535\u4e0e\u94c1\u7535\u7279\u6027\u6b63\u63a8\u52a8\u5176\u5728DRAM\u3001FeRAM\u3001\u94c1\u7535\u573a\u6548\u5e94\u6676\u4f53\u7ba1\uff08FeFET\uff09\u53ca\u94c1\u7535\u96a7\u9053\u7ed3\uff08FTJ\uff09\u7b49\u591a\u79cd\u4fe1\u606f\u5b58\u50a8\u5668\u4ef6\u4e2d\u7684\u5e7f\u6cdb\u5e94\u7528\u4e0e\u6df1\u5165\u53d1\u5c55\u3002<\/p>\n\n\n\n<figure class=\"wp-block-image aligncenter size-full is-resized\"><img loading=\"lazy\" decoding=\"async\" width=\"550\" height=\"200\" src=\"https:\/\/mofei-lab.site\/wp-content\/uploads\/2026\/02\/image-6.png\" alt=\"\" class=\"wp-image-437\" style=\"aspect-ratio:2.7501765952437016;width:774px;height:auto\" srcset=\"https:\/\/mofei-lab.site\/wp-content\/uploads\/2026\/02\/image-6.png 550w, https:\/\/mofei-lab.site\/wp-content\/uploads\/2026\/02\/image-6-300x109.png 300w, https:\/\/mofei-lab.site\/wp-content\/uploads\/2026\/02\/image-6-18x7.png 18w\" sizes=\"auto, (max-width: 550px) 100vw, 550px\" \/><\/figure>\n\n\n\n<p class=\"has-text-align-center\">\u6a21\u62df Vc \u5206\u5e03\u3001P-V \u548c J-V \u66f2\u7ebf\uff0c\u5728\u5faa\u73af\u6f14\u5316\u8fc7\u7a0b\u4e2d\uff1a\u9192\u6765\uff083 MV\/cm\uff09\u3001\u75b2\u52b3\uff081.2 MV\/cm\uff09\u548c\u6062\u590d\uff084 MV\/cm\uff09<\/p>\n\n\n\n<p>\u5728\u7b97\u529b\u9700\u6c42\u5448\u6307\u6570\u7ea7\u589e\u957f\u7684\u65f6\u4ee3\uff0c\u94c1\u7535\u5b58\u50a8\u5668\u56e0\u5176\u975e\u6613\u5931\u5b58\u50a8\u7279\u6027\u548c\u4f4e\u529f\u8017\u4f18\u52bf\uff0c\u6210\u4e3a\u795e\u7ecf\u5f62\u6001\u8ba1\u7b97\u548c\u5b58\u5185\u8ba1\u7b97\u67b6\u6784\u7684\u53ef\u9760\u9009\u62e9\uff0c\u5176\u4e2d\u94ea\u57fa\u94c1\u7535\u5b58\u50a8\u5668\u51ed\u501f\u5176\u4e0e\u6807\u51c6\u4e92\u8865\u91d1\u5c5e\u6c27\u5316\u7269\u534a\u5bfc\u4f53\uff08CMOS\uff09\u5de5\u827a\u7684\u5b8c\u7f8e\u517c\u5bb9\u6027\u4ee5\u53ca\u4f18\u5f02\u7684\u4e09\u7ef4\u96c6\u6210\u80fd\u529b\uff0c\u5c55\u73b0\u51fa\u5353\u8d8a\u7684\u6027\u80fd\u6f5c\u529b\u3002\u7136\u800c\uff0c\u5bf9\u6bd4\u4f20\u7edf\u7684\u94c1\u7535\u5668\u4ef6\uff0c\u94ea\u57fa\u94c1\u7535\u5668\u4ef6\u7684\u53ef\u9760\u6027\u95ee\u9898\u5c24\u4e3a\u7a81\u51fa\uff1a\u5176\u5728\u7ecf\u538610\u2076\u6b21\u8bfb\u5199\u5faa\u73af\u540e\u5373\u51fa\u73b0\u663e\u8457\u7684\u75b2\u52b3\u6548\u5e94\uff08\u53ef\u53cd\u8f6c\u6781\u5316\u503c\u9010\u6e10\u964d\u4f4e\uff09\uff0c\u5bfc\u81f4\u8bfb\u5199\u7a97\u53e3\u6025\u5267\u51cf\u5c0f\uff1b\u5f53\u64cd\u4f5c\u6b21\u6570\u8fbe10\u2078\u6b21\u65f6\uff0c\u8584\u819c\u6f0f\u7535\u6d41\u5bc6\u5ea6\u663e\u8457\u589e\u52a0\uff0c\u8fdb\u4e00\u6b65\u5bfc\u81f4\u51fb\u7a7f\uff0c\u4e25\u91cd\u5a01\u80c1\u5668\u4ef6\u4f7f\u7528\u5bff\u547d\u3002\u56e0\u6b64\uff0c\u94ea\u57fa\u94c1\u7535\u5b58\u50a8\u5668\u7684\u6297\u75b2\u52b3\u7279\u6027\u548c\u8010\u4e45\u6027\u7b49\u53ef\u9760\u6027\u95ee\u9898\uff0c\u5df2\u6210\u4e3a\u5236\u7ea6\u5176\u53d1\u5c55\u7684\u5173\u952e\u56e0\u7d20\u3002<\/p>\n\n\n\n<figure class=\"wp-block-image aligncenter size-full\"><img loading=\"lazy\" decoding=\"async\" width=\"550\" height=\"277\" src=\"https:\/\/mofei-lab.site\/wp-content\/uploads\/2026\/02\/image-7.png\" alt=\"\" class=\"wp-image-439\" srcset=\"https:\/\/mofei-lab.site\/wp-content\/uploads\/2026\/02\/image-7.png 550w, https:\/\/mofei-lab.site\/wp-content\/uploads\/2026\/02\/image-7-300x151.png 300w, https:\/\/mofei-lab.site\/wp-content\/uploads\/2026\/02\/image-7-18x9.png 18w\" sizes=\"auto, (max-width: 550px) 100vw, 550px\" \/><\/figure>\n\n\n\n<p class=\"has-text-align-center\">\u57fa\u4e8e HZO \u7684\u94c1\u7535\u7535\u5bb9\u5668\u4e2d\u5524\u9192\u3001\u75b2\u52b3\u548c\u6062\u590d\u673a\u5236\u7684\u793a\u610f\u56fe\u3002\u7bad\u5934\u8868\u793a\u6bcf\u6b21\u8fc7\u7a0b\u540e\u7c92\u5b50\u7535\u8377\u6001\u53d8\u5316\u7684\u65b9\u5411<\/p>\n\n\n\n<h3 class=\"wp-block-heading\">\u8bfe\u9898\u7ec4\u4fa7\u91cd\u70b9\u4e0e\u4f18\u52bf<\/h3>\n\n\n\n<p><\/p>\n\n\n\n<h3 class=\"wp-block-heading\">\u5df2\u53d6\u5f97\u7684\u7814\u7a76\u8fdb\u5c55<\/h3>\n\n\n\n<p><\/p>\n\n\n\n<h3 class=\"wp-block-heading\"><strong>\u53c2\u8003\u6587\u732e<\/strong><\/h3>\n\n\n\n<ol class=\"wp-block-list\">\n<li>Fei Mo, Takuya Saraya, Toshiro Hiramoto, and Masaharu Kobayashi, &#8220;Reliability characteristics of metal\/ferroelectric-HfO2\/IGZO\/metal capacitor for non-volatile memory application,&#8221;&nbsp;<em>Appl. Phys. Express<\/em>&nbsp;<strong>13<\/strong>, 074005 (2020).&nbsp;<a href=\"https:\/\/doi.org\/10.35848\/1882-0786\/ab9a92\" target=\"_blank\" rel=\"noreferrer noopener\">https:\/\/doi.org\/10.35848\/1882-0786\/ab9a92<\/a><\/li>\n\n\n\n<li>U. Celano et al., &#8220;Probing the Evolution of Electrically Active Defects in Doped Ferroelectric HfO2 during Wake-Up and Fatigue,&#8221; 2020 IEEE Symposium on VLSI Technology, Honolulu, HI, USA, 2020, pp. 1-2, doi: 10.1109\/VLSITechnology18217.2020.9265098. <\/li>\n\n\n\n<li>C. -Y. Cho, T. -Y. Chao, Y. -L. Shih, T. -Y. Lin and T. -H. Hou, &#8220;Interplay Between Charge Defects and Ferroelectric Reliability: From Wake-Up, Imprint, Fatigue to Breakdown,&#8221; 2025 IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA, 2025, pp. 1-6, doi: 10.1109\/IRPS48204.2025.10983640. <\/li>\n<\/ol>\n\n\n\n<p><\/p>","protected":false},"excerpt":{"rendered":"<p>\u968f\u7740\u9ad8\u6027\u80fd\u8ba1\u7b97\u4e0e\u5927\u6570\u636e\u5b58\u50a8\u9700\u6c42\u7684\u6301\u7eed\u6500\u5347 [&hellip;]<\/p>","protected":false},"author":1,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"site-sidebar-layout":"default","site-content-layout":"","ast-site-content-layout":"default","site-content-style":"default","site-sidebar-style":"default","ast-global-header-display":"","ast-banner-title-visibility":"","ast-main-header-display":"","ast-hfb-above-header-display":"","ast-hfb-below-header-display":"","ast-hfb-mobile-header-display":"","site-post-title":"","ast-breadcrumbs-content":"","ast-featured-img":"","footer-sml-layout":"","ast-disable-related-posts":"","theme-transparent-header-meta":"","adv-header-id-meta":"","stick-header-meta":"","header-above-stick-meta":"","header-main-stick-meta":"","header-below-stick-meta":"","astra-migrate-meta-layouts":"default","ast-page-background-enabled":"default","ast-page-background-meta":{"desktop":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"tablet":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"mobile":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""}},"ast-content-background-meta":{"desktop":{"background-color":"var(--ast-global-color-4)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"tablet":{"background-color":"var(--ast-global-color-4)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""},"mobile":{"background-color":"var(--ast-global-color-4)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-opacity":"","overlay-gradient":""}},"footnotes":""},"categories":[22],"tags":[],"class_list":["post-266","post","type-post","status-publish","format-standard","hentry","category-22"],"_links":{"self":[{"href":"https:\/\/mofei-lab.site\/en\/wp-json\/wp\/v2\/posts\/266","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/mofei-lab.site\/en\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/mofei-lab.site\/en\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/mofei-lab.site\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/mofei-lab.site\/en\/wp-json\/wp\/v2\/comments?post=266"}],"version-history":[{"count":16,"href":"https:\/\/mofei-lab.site\/en\/wp-json\/wp\/v2\/posts\/266\/revisions"}],"predecessor-version":[{"id":441,"href":"https:\/\/mofei-lab.site\/en\/wp-json\/wp\/v2\/posts\/266\/revisions\/441"}],"wp:attachment":[{"href":"https:\/\/mofei-lab.site\/en\/wp-json\/wp\/v2\/media?parent=266"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/mofei-lab.site\/en\/wp-json\/wp\/v2\/categories?post=266"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/mofei-lab.site\/en\/wp-json\/wp\/v2\/tags?post=266"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}